Braggly
XRD analysis & Rietveld
API: …
Load sample
Open files
Normalize
Raw
Max = 100
Max = 1
Log Y
Show pattern
Export SVG
Export PNG
Drop your diffractogram here
.xy · .dat · .txt · .csv · .xrdml · .raw — or
browse
/
load a sample
Peaks & analysis
Label peaks
Fit peak
Find peaks
Index (CIF)
Sensitivity
%
Show
hkl
2θ
d
λ
Clear labels
Peak fit results
System
cubic
tetragonal
hexagonal / trigonal
orthorhombic
Refine cell
Export CSV
Clear
#
Dataset
h k l
2θ (°)
FWHM (°)
d (Å)
Area
Height
Scherrer (nm)
η
R²
View & export options
Subtract background
Stack offset
Publication style
Title
X axis
Y axis
Rietveld refinement
GSAS-II
Choose CIF / .pcr
No file
Choose instprm
optional
Run Rietveld
Export .pcr
Export CIF
Export .inp
Export .gpx
Export data
Refinement parameters
All
None
cell
background
zero
profile Gaussian (U,V,W)
profile Lorentzian (X,Y)
asymmetry
atoms (Uiso)
atoms (pos)
pref. orient.
axis
c [001]
a [100]
[110]
[104]
[111]
microstrain (c)
occupancies
sample shift
Load a pattern + choose a CIF (or a FullProf .pcr — its cell / space group / atoms are imported), then Run. Instrument file optional (a Cu Kα default is used). Results (obs / calc / difference) appear in the plot above.